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09
2023
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02
The difference between UHAST and BHAST in high pressure accelerated aging test chamber
HAST (Highly Accelerated Temperature and Humidity Pressure Test) is a highly accelerated, temperature - and humidity-based reliability test method for electronic components. HAST high accelerated aging test plays an important role in plastic sealed devices, which accelerates the failure of new integrated circuits based on temperature and humidity and speeds up the development and application of plastic sealed devices.
HAST high accelerated aging tests are divided into UHAST tests and BHAST tests. What is the difference between the two? Comin will explain them all.
The difference between UHAST and BHAST:
UHAST test: refers to the test of temperature and humidity without bias and high acceleration stress. It is used to determine the reliability of components under high temperature and humidity conditions and does not bias components.
Reference standard: JESD22-A118
BHAST test: refers to temperature and humidity bias and high acceleration stress test, make the devices subjected to high temperature and humidity conditions, at the same time under bias, its goal is to accelerate corrosion of the devices.
Reference standard: JESD22-A110
Test conditions for UHAST and BHAST:
Temperature, humidity, air pressure, test time
◎ 130℃, 85%RH, 230KPa atmospheric pressure, 96hours of test time.
◎ During the test, it is suggested to calculate the chip junction temperature by monitoring the chip shell temperature and power consumption data in the debugging stage, and ensure that the junction temperature is not too high, and record it regularly during the test. The junction temperature calculation method is referred to HTOL Test Technical Specification.
◎ If the following three relationships between shell temperature and ring temperature difference or power consumption are satisfied, especially when the shell temperature and ring temperature difference exceed 10℃, the periodic voltage pulling strategy should be considered.
◎ Note that the starting time of the test is calculated after the environmental conditions reach the specified conditions; The end time is the time point at which the cooling and depressurization operation starts.
Voltage deviation --
UHAST tests are not biased and do not need to focus on the following principles.
BHAST must be biased and follow the following principles:
◎ Power on all power supplies, voltage: the maximum recommended operating range voltage.
◎ Minimum power consumption of chip and material (digital part does not flip, input crystal short-circuiting, other power reduction methods).
◎ The input pin should be raised within the allowable range of input voltage.
◎ Other pins, such as clock end, reset end and output pin, randomly pull up or down within the output range.
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