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Semiconductors can be divided into four categories: integrated circuits, discrete devices, sensors and optoelectronic devices, these four categories can be collectively referred to as semiconductor components. TIn semiconductor devices, some common acceleration factors are temperature, humidity, voltage, and current. In most cases, accelerated testing does not change the physical characteristics of the fault, but changes the observation time. The change between accelerated conditions and normal use conditions is called "derating".Yuanyao can provide you with various environmental test chambers for high temperature cycle test, high temperature life working test, temperature and humidity bias high accelerated stress test and high temperature storage test for semiconductors.
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