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PCT aging chamber


PCT Aging Chamber (also known as PCT High Pressure Accelerated Aging Tester) is mainly used to test the moisture capacity of semiconductor packages. The products to be tested are tested under severe temperature, humidity and pressure. Moisture will flow along the colloid or colloid and wire. The interface of the frame penetrates into the package body, and the common failure mode is an open circuit caused by corrosion of the active metallization area, or a short circuit caused by contamination between the pins of the package body, etc.   

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PCT Aging Chamber

PCT aging chamber


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